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1.
Testability Concepts for Digital ICs
Testability Concepts for Digital ICs
By: A.P. Thijssen, F.P.M. Beenker, R.G. Bennetts
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED686
Binding:
Paperback
Release:
04 Oct 2012
Language:
English
International Edition
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2.
Testability Concepts for Digital ICs
Testability Concepts for Digital ICs
By: A.P. Thijssen, F.P.M. Beenker, R.G. Bennetts
Publisher: Springer
No Review Yet
AED692
Binding:
Hardback
Release:
30 Nov 1995
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
Digital Techniques
Digital Techniques
By: etc., A. P. Thijssen, H.A. Vink
Publisher: Hodder Arnold
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AED145
Binding:
Paperback
Release:
01 May 1989
Out of Stock
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4.
Variations
Variations
By: N. J. Habraken, A. P. Thijssen, J. Th. Boekholt, P. J. M. Dinjens
Publisher: MIT Press Ltd
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AED80
Binding:
Paperback
Release:
15 Oct 1976
Language:
English
Out of Stock
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