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Alain C Diebold

Alain C Diebold

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1.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
AED678
Binding:
Mixed media product
Release:
26 Oct 2009
Language:
English
Available
Ships within 12-14 Days Explain..
Free Shipping in UAE.
2.
Handbook of Silicon Semiconductor Metrology
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold, Alain C. (Sematech, Austin, Texas, USA) Diebold, Alain C Diebold
Publisher: Taylor and Francis
No Review Yet
AED853
Binding:
Paperback
Release:
17 Oct 2019
Language:
English
International Edition
Ships within 26-28 Days Explain..
Free Shipping in UAE.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Handbook of Silicon Semiconductor Metrology
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold, Diebold C. Diebold, Alain C. (Sematech, Austin, Texas, USA) Diebold
Publisher: Taylor & Francis Inc
No Review Yet
AED3,918
Binding:
Hardback
Release:
29 Jun 2001
Language:
English
International Edition
Ships within 26-28 Days Explain..
Free Shipping in UAE.
4.
Characterization and Metrology for ULSI Technology 2005
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
AED2,929
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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5.
Characterization and Metrology for ULSI Technology
Characterization and Metrology for ULSI Technology
By: Robert McDonald, W Murray Bullis, E Jane Walters, David G Seiler, Alain C Diebold
Publisher: American Institute of Physics
No Review Yet
AED1,518
Binding:
Mixed media product
Release:
14 Dec 1998
Language:
English
Out of Stock
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6.
Characterization and Metrology for ULSI Technology
Characterization and Metrology for ULSI Technology
By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula
Publisher: American Institute of Physics
No Review Yet
AED2,180
Binding:
Mixed media product
Release:
08 Oct 2003
Language:
English
Out of Stock
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7.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
AED1,920
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
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8.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
AED1,853
Binding:
Mixed media product
Release:
01 Sep 2007
Language:
English
Out of Stock
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