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Alain C. Diebold

Alain C. Diebold

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1.
Handbook of Silicon Semiconductor Metrology
Handbook of Silicon Semiconductor Metrology
By: Alain C. Diebold, Alain C. (Sematech, Austin, Texas, USA) Diebold, Alain C Diebold
Publisher: Taylor and Francis
No Review Yet
AED828
Binding:
Paperback
Release:
17 Oct 2019
Language:
English
International Edition
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Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
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2.
Characterization and Metrology for ULSI Technology 2005
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
AED2,931
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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3.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
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AED1,920
Binding:
Book
Release:
26 Apr 2012
Language:
English
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