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1.
VLSI Design for Manufacturing: Yield Enhancement
VLSI Design for Manufacturing: Yield Enhancement
By: Andrzej J. Strojwas, Wojciech Maly, Stephen W. Director, Stephen W Director, Andrzej J Strojwas
Publisher: Springer
No Review Yet
AED677
Binding:
Paperback
Release:
21 Sep 2011
Language:
English
International Edition
Ships within 14-16 Days Explain..
2.
A Unified Approach for Timing Verification and Delay Fault Testing
A Unified Approach for Timing Verification and Delay Fault Testing
By: Mukund Sivaraman, Andrzej J Strojwas
Publisher: Springer
No Review Yet
AED476
Binding:
Hardback
Release:
30 Nov 1997
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
A Unified Approach for Timing Verification and Delay Fault Testing
A Unified Approach for Timing Verification and Delay Fault Testing
By: Mukund Sivaraman, Andrzej J Strojwas
Publisher: Springer
No Review Yet
AED467
Binding:
Paperback
Release:
13 Sep 2012
Language:
English
International Edition
Ships within 24-26 Days Explain..
4.
VLSI Design for Manufacturing: Yield Enhancement
VLSI Design for Manufacturing: Yield Enhancement
By: Robin Davidson, Wojciech Maly, Ewa Lipska, Stephen W Director, Andrzej J Strojwas
Publisher: Springer
No Review Yet
AED678
Binding:
Hardback
Release:
30 Nov 1989
Language:
English
International Edition
Ships within 14-16 Days Explain..
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