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Cher Ming Tan

Cher Ming Tan

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1.
Reliability Analysis of Electrotechnical Devices
Reliability Analysis of Electrotechnical Devices
By: Cher Ming Tan
Publisher: Mdpi AG
No Review Yet
AED228
Binding:
Hardback
Release:
20 Jul 2022
Language:
English
International Edition
Ships within 14-16 Days Explain..
2.
Reliability and Failure Analysis of High-Power Led Packaging
Reliability and Failure Analysis of High-Power Led Packaging
By: Cher Ming Tan, Preetpal Singh, Cher Ming (Chang Gung University, Taiwan and Director of Centre of Reliability Science and Technology) Tan, Preetpal (Center for Reliability Engineering, Ming Chi University of Technology, Taiwan) Singh, Cher Ming (Center for Reliability Sciences and Technologies, Chang Gung University, Taiwan; Center for Reliability Engineering, Ming Chi University of Technology, Taiwan) Tan
Publisher: Elsevier Science
No Review Yet
AED668
Binding:
Paperback
Release:
01 Nov 2021
Language:
English
International Edition
Ships within 18-20 Days Explain..
3.
Graphene and VLSI Interconnects
Graphene and VLSI Interconnects
By: Cher Ming Tan, Udit Narula, Vivek Sangwan, Cher-Ming Tan
Publisher: Jenny Stanford Publishing
No Review Yet
AED383
Binding:
Hardback
Release:
31 Oct 2021
Language:
English
Available
Ships within 12-14 Days Explain..
4.
Electromigration in ULSI Interconnections
Electromigration in ULSI Interconnections
By: Cher Ming Tan, Arijit Roy, Cher Ming (Ntu, S'pore) Tan
Publisher: World Scientific Publishing Company
No Review Yet
AED348
Binding:
Hardback
Release:
25 Aug 2010
Language:
English
Available
Ships within 2-4 Days Explain..
5.
Electromigration Modeling at Circuit Layout Level
Electromigration Modeling at Circuit Layout Level
By: Cher Ming Tan, Feifei He
Publisher: Springer
No Review Yet
AED188
Binding:
Paperback
Release:
04 May 2013
Language:
English
Available
Ships within 2-4 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
6.
Simulated Annealing
Simulated Annealing
By: Cher Ming Tan
Publisher: In Tech
No Review Yet
AED642
Binding:
Hardback
Release:
01 Sep 2008
Language:
English
International Edition
Ships within 14-16 Days Explain..
7.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
By: Wei Li, Cher Ming Tan, Zhenghao Gan, Yuejin Hou
Publisher: Springer
No Review Yet
AED467
Binding:
Paperback
Release:
21 Apr 2013
Language:
English
International Edition
Ships within 24-26 Days Explain..
8.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
By: Wei Li, Cher Ming Tan, Zhenghao Gan, Yuejin Hou
Publisher: Springer
No Review Yet
AED430
Binding:
Hardback
Release:
07 Mar 2011
Language:
English
Available
Ships within 2-4 Days Explain..
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