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1.
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
By: Brian K Tanner, D.K. Bowen, Brian K. Tanner, D. Keith Bowen, D K Bowen
Publisher: CRC Press
No Review Yet
AED1,344
Binding:
Hardback
Release:
05 Feb 1998
Language:
English
Available
Ships within 20-22 Days Explain..
Free Shipping in UAE.
2.
High Resolution X-Ray Diffractometry and Topography
High Resolution X-Ray Diffractometry and Topography
By: Brian K Tanner, D.K. Bowen, Brian K. Tanner, D K Bowen
Publisher: Taylor and Francis
No Review Yet
AED740
Binding:
Paperback
Release:
12 Oct 2019
Language:
English
International Edition
Ships within 26-28 Days Explain..
Free Shipping in UAE.
3.
X-Ray Metrology in Semiconductor Manufacturing
X-Ray Metrology in Semiconductor Manufacturing
By: Brian K Tanner, D Keith Bowen, Brian K. (University of Durham, UK) Tanner, D. Keith (Bede Plc, Durham, UK) Bowen, D. Keith (Sarah Bowen, PhD, Addictive Behaviors Research Center, University of Washington, Seattle, WA) Bowen
Publisher: CRC Press
No Review Yet
AED1,251
Binding:
Hardback
Release:
24 Jan 2006
Language:
English
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