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1.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, John Henry Scott, Joseph R. Michael, Joseph Goldstein, Joseph I. Goldstein
Publisher: Springer
5.0 (1)
AED777
Binding:
Hardback
Release:
18 Nov 2017
Language:
English
Available
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2.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph R. Michael, Joseph I. Goldstein, David C. Joy, David C Joy
Publisher: Springer New York
No Review Yet
AED756
Binding:
Paperback
Release:
30 Aug 2018
Language:
English
Available
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3.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph Goldstein, D. C. Joy, Patrick Echlin, David C. Joy
Publisher: Springer
No Review Yet
AED868
Binding:
Hardback
Release:
31 Mar 1986
Language:
English
Available
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4.
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
By: Dale E. Newbury, Charles E. Lyman, Alton D., Jr. Romig, David B Williams, Alton D. Romig Jr.
Publisher: Springer
No Review Yet
AED1,076
Binding:
Hardback
Release:
31 Aug 1990
Language:
English
International Edition
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5.
X-Ray Spectrometry in Electron Beam Instruments
X-Ray Spectrometry in Electron Beam Instruments
By: Dale E. Newbury, David B Williams, Joseph Goldstein, Joseph I. Goldstein, David B. Williams
Publisher: Springer
No Review Yet
AED2,044
Binding:
Paperback
Release:
21 Oct 2012
Language:
English
International Edition
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6.
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph Goldstein, Patrick Echlin, David C. Joy, C.E. Fiori
Publisher: Springer
No Review Yet
AED1,076
Binding:
Paperback
Release:
08 Jun 2013
Language:
English
International Edition
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Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
7.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Charles Fiori, Joseph Goldstein, Patrick Echlin, David C. Joy
Publisher: Springer
No Review Yet
AED1,092
Binding:
Paperback
Release:
20 Mar 2013
Language:
English
International Edition
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8.
Electron Probe Quantitation
Electron Probe Quantitation
By: K. F. J. Heinrich, D. Newbury, Dale Newbury, K F J Heinrich, D Newbury
Publisher: Springer
No Review Yet
AED2,042
Binding:
Paperback
Release:
30 May 2013
Language:
English
International Edition
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9.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Echlin Patrick Echlin, Goldstein Joseph Goldstein, Newbury Dale E. Newbury
Publisher: Springer Nature B.V.
No Review Yet
AED541
Binding:
Paperback
Release:
02 Jun 2013
Language:
English
International Edition
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10.
X-Ray Spectrometry in Electron Beam Instruments
X-Ray Spectrometry in Electron Beam Instruments
By: David B Williams, Joseph Goldstein, Dale E Newbury
Publisher: Springer
No Review Yet
AED2,107
Binding:
Hardback
Release:
31 Mar 1995
Language:
English
International Edition
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11.
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition
By: Dale E. Newbury, Charles E. Lyman, Linda Sawyer, Joseph Goldstein, Patrick Echlin
Publisher: Springer
No Review Yet
AED709
Binding:
Hardback
Release:
30 Apr 2007
Language:
English
Out of Stock
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12.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Newbury Dale E. Newbury, Goldstein Joseph I. Goldstein, Michael Joseph R. Michael
Publisher: Springer Nature B.V.
No Review Yet
AED481
Binding:
Paperback
Release:
18 Nov 2017
Language:
English
Out of Stock
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13.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Goldstein Joseph Goldstein, Newbury Dale E. Newbury, Joy David C. Joy
Publisher: Springer Nature B.V.
No Review Yet
AED481
Binding:
Paperback
Release:
01 Sep 2011
Language:
English
Out of Stock
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