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Metrology and Diagnostic Techniques for Nanoelectronics

By: David G. Seiler, Zhiyong Ma, David G Seiler

Publisher: Pan Stanford Publishing

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AED2,319

Binding:	Hardback
Release:	03 Oct 2016
Language:	English

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Characterization and Metrology for ULSI Technology 2005

By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold

Publisher: Springer

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AED2,931

Binding:	Hardback
Release:	01 Sep 2005
Language:	English

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Frontiers of Characterization and Metrology for Nanoelectronics

By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr

Publisher: American Institute of Physics

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AED1,855

Binding:	Mixed media product
Release:	01 Sep 2007
Language:	English

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Characterization and Metrology for ULSI Technology

By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula

Publisher: American Institute of Physics

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AED2,182

Binding:	Mixed media product
Release:	08 Oct 2003
Language:	English

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Frontiers of Characterization and Metrology for Nanoelectronics: 2011

By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula

Publisher: American Institute of Physics

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AED1,920

Binding:	Book
Release:	26 Apr 2012
Language:	English

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