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David G. McDonald

David G. McDonald

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1.
The Psychological Effects of Aerobic Fitness Training
The Psychological Effects of Aerobic Fitness Training
By: David G. McDonald, James A. Hodgdon, David G McDonald, James A Hodgdon
Publisher: Springer
No Review Yet
AED628
Binding:
Paperback
Release:
07 Aug 1991
Language:
English
Available
Ships within 9-10 Days Explain..
Free Shipping in UAE.
2.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
AED677
Binding:
Mixed media product
Release:
26 Oct 2009
Language:
English
Available
Ships within 12-14 Days Explain..
Free Shipping in UAE.
3.
Ptycholepis Marshi Newberry
Ptycholepis Marshi Newberry
By: David Hosbrook Joint Author Dunkle, Bobb Schaeffer, Nicholas G Joint Author McDonald
Publisher: Creative Media Partners, LLC
No Review Yet
AED166
Binding:
Paperback
Release:
20 Feb 2018
Language:
English
International Edition
Ships within 20-22 Days Explain..
Free Shipping in UAE.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
4.
Defending Mexican Valor in Texas
Defending Mexican Valor in Texas
By: David R. McDonald, Timothy M. Matovina, Jose Antonio Navarro, Timothy M Matovina, David R McDonald
Publisher: TX A&m-McWhiney Foundation
No Review Yet
AED184
Binding:
Paperback
Release:
04 Apr 1995
Language:
English
International Edition
Ships within 20-22 Days Explain..
Free Shipping in UAE.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
5.
ReDeus
ReDeus
By: Lorraine Anderson, Aaron Rosenberg, David McDonald, Lawrence M Schoen
Publisher: Crazy 8 Press
No Review Yet
AED208
Binding:
Paperback
Release:
21 Jul 2013
Language:
English
International Edition
Ships within 20-22 Days Explain..
Free Shipping in UAE.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
6.
Characterization and Metrology for ULSI Technology
Characterization and Metrology for ULSI Technology
By: Robert McDonald, W Murray Bullis, E Jane Walters, David G Seiler, Alain C Diebold
Publisher: American Institute of Physics
No Review Yet
AED1,519
Binding:
Mixed media product
Release:
14 Dec 1998
Language:
English
Out of Stock
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7.
Ptycholepis Marshi Newberry
Ptycholepis Marshi Newberry
By: David Hosbrook Joint Author Dunkle, Bobb Schaeffer, Nicholas G Joint Author McDonald
Publisher: Palala Press
No Review Yet
AED131
Binding:
Hardback
Release:
06 Sep 2015
Language:
English
Out of Stock
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8.
Characterization and Metrology for ULSI Technology 2005
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
AED2,931
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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9.
Frontiers of Characterization and Metrology for Nanoelectronics
Frontiers of Characterization and Metrology for Nanoelectronics
By: Robert McDonald, David G Seiler, Alain C Diebold, C Michael Garner, Dan Herr
Publisher: American Institute of Physics
No Review Yet
AED1,855
Binding:
Mixed media product
Release:
01 Sep 2007
Language:
English
Out of Stock
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10.
Characterization and Metrology for ULSI Technology
Characterization and Metrology for ULSI Technology
By: Stefan Zollner, Robert McDonald, David G Seiler, Alain C Diebold, Eric M Secula
Publisher: American Institute of Physics
No Review Yet
AED2,182
Binding:
Mixed media product
Release:
08 Oct 2003
Language:
English
Out of Stock
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11.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
AED1,920
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
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