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1.
Metrology and Diagnostic Techniques for Nanoelectronics
Metrology and Diagnostic Techniques for Nanoelectronics
By: David G. Seiler, Zhiyong Ma, David G Seiler
Publisher: Pan Stanford Publishing
No Review Yet
AED2,802
Binding:
Hardback
Release:
03 Oct 2016
Language:
English
Available
Ships within 20-22 Days Explain..
Free Shipping in UAE.
2.
Investing for Better: Harnessing the Four Driving Forces of Asset Management to Build a Wealthier and More Equitable World
Investing for Better: Harnessing the Four Driving Forces of Asset Management to Build a Wealthier and More Equitable World
By: Daniel Seiler, David Seiler
Publisher: McGraw-Hill Education
No Review Yet
AED282
Binding:
Hardback
Release:
12 Apr 2024
International Edition
Ships within 26-28 Days Explain..
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3.
Characterization and Metrology for ULSI Technology 2005
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
AED2,931
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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4.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
AED1,920
Binding:
Book
Release:
26 Apr 2012
Language:
English
Out of Stock
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