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Diane Eichert

Diane EichertDiane Eichert studied physico-chemistry at Bordeaux University and received her DEA in 1998. She earned her doctorate in Materials Science at Ecole Polytechnique of Toulouse (2001). She conducted post-doctoral research at the European Radiation Synchotron Facility, Grenoble and Marie Curie Excellence Grant as scientist at Bessy II, Berlin, both in X-ray spectro-microscopies. Since 2007, she's been a senior scientist at Elettra Sincrotrone Trieste in the field of X-ray Fluorescence Analysis, where she developed instrumentation and beamline, XRF data analysis skills and applications in many fields of research. Her main interests reside in combining various X-ray and Infrared based analysis on the same sample (mainly biology and nanomaterials) and establishing reliable chemical measurement process with X-ray Fluorescence techniques. Read More Read Less

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Practical Guide to Total Reflection X-Ray Fluorescence
Publisher: Elsevier Science
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AED920
Binding:
Paperback
Release:
01 Nov 2023
Language:
English
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