eishi ibe author - Books - 24x7 online bookstore Bookswagon.ae
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1.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
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2.
Dependability in Electronic Systems
Publisher: Springer
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AED691
Binding:
Hardback
Release:
24 Nov 2010
Language:
English
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3.
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Publisher: John Wiley & Sons
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AED1,458
Binding:
Hardback
Release:
09 Feb 2015
Language:
English
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4.
Dependability in Electronic Systems
Publisher: Springer
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AED1,062
Binding:
Paperback
Release:
09 Oct 2014
Language:
English
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