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Guido Groeseneken

Guido Groeseneken

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1.
Reliability of High Mobility Sige Channel Mosfets for Future CMOS Applications
Publisher: Springer
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AED938
Binding:
Hardback
Release:
29 Oct 2013
Language:
English
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2.
Reliability of High Mobility Sige Channel Mosfets for Future CMOS Applications
Publisher: Springer
No Review Yet
AED716
Binding:
Paperback
Release:
23 Aug 2016
Language:
English
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