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Görschwin Fey

Görschwin Fey

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1.
Test Pattern Generation Using Boolean Proof Engines
Test Pattern Generation Using Boolean Proof Engines
By: Stephan Eggersglu, Görschwin Fey, Rolf Drechsler, Goerschwin Fey, Gorschwin Fey
Publisher: Springer
No Review Yet
AED438
Binding:
Hardback
Release:
30 Apr 2009
Language:
English
Available
Ships within 1-2 Days Explain..
2.
Test Pattern Generation Using Boolean Proof Engines
Test Pattern Generation Using Boolean Proof Engines
By: Stephan Eggersglu, Görschwin Fey, Rolf Drechsler, Goerschwin Fey, Gorschwin Fey
Publisher: Springer
No Review Yet
AED430
Binding:
Paperback
Release:
19 Oct 2010
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
Advanced BDD Optimization
Advanced BDD Optimization
By: Görschwin Fey, Rolf Drechsler, Goerschwin Fey, Rudiger Ebendt, Gorschwin Fey
Publisher: Springer
No Review Yet
AED367
Binding:
Hardback
Release:
01 Aug 2005
Language:
English
Available
Ships within 1-2 Days Explain..
4.
Advanced BDD Optimization
Advanced BDD Optimization
By: Görschwin Fey, Rolf Drechsler, Goerschwin Fey, Rudiger Ebendt, Gorschwin Fey
Publisher: Springer
No Review Yet
AED552
Binding:
Paperback
Release:
29 Oct 2010
Language:
English
International Edition
Ships within 14-16 Days Explain..
5.
Robustness and Usability in Modern Design Flows
Robustness and Usability in Modern Design Flows
By: Görschwin Fey, Rolf Drechsler, Goerschwin Fey, Gorschwin Fey
Publisher: Springer
No Review Yet
AED322
Binding:
Hardback
Release:
08 Jan 2008
Language:
English
Available
Ships within 1-2 Days Explain..
6.
Robustness and Usability in Modern Design Flows
Robustness and Usability in Modern Design Flows
By: Görschwin Fey, Rolf Drechsler, Goerschwin Fey, Gorschwin Fey
Publisher: Springer
No Review Yet
AED430
Binding:
Paperback
Release:
19 Oct 2010
Language:
English
International Edition
Ships within 14-16 Days Explain..
7.
Debug Automation from Pre-Silicon to Post-Silicon
Debug Automation from Pre-Silicon to Post-Silicon
By: Görschwin Fey, Gorschwin Fey, Mehdi Dehbashi
Publisher: Springer
No Review Yet
AED242
Binding:
Hardback
Release:
09 Oct 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
8.
Test Digitaler Schaltkreise
Test Digitaler Schaltkreise
By: Stephan Eggersglu, Ilia Polian, Görschwin Fey, Goerschwin Fey, Gorschwin Fey
Publisher: Walter de Gruyter
No Review Yet
AED376
Binding:
Paperback
Release:
29 Jan 2014
Language:
German
International Edition
Ships within 14-16 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
9.
Debug Automation from Pre-Silicon to Post-Silicon
Debug Automation from Pre-Silicon to Post-Silicon
By: Görschwin Fey, Goerschwin Fey, Gorschwin Fey, Mehdi Dehbashi
Publisher: Springer
No Review Yet
AED161
Binding:
Paperback
Release:
10 Sep 2016
Language:
English
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