Buy books written by J Patrick Meyer Available at Bookswagon

Flat 10% Off Upto 10AED - Use Code FLAT10

Purchase Any Book And Get 5AED Off - Use Code FIRST

Flat 10% Off Upto 10AED - Use Code FLAT10

Purchase Any Book And Get 5AED Off - Use Code FIRST

Flat 10% Off Upto 10AED - Use Code FLAT10

Purchase Any Book And Get 5AED Off - Use Code FIRST

BooksWagon Icon
Logo1
Login & Sign up
AddBanner
Home icon Home
Account Icon Account
Wishlist Icon Wishlist
Cart Icon Cart
humburger icon Categories
Close

Refine your Search

Availability

Shipping Time

Source

Binding

Language

Publication Year

Filter By Category
J Patrick Meyer

J Patrick Meyer

3 results found
List viewGrid view
Sort By:
1.
Applied Measurement with jMetrik
Applied Measurement with jMetrik
By: J Patrick Meyer, J. Patrick (University of Virginia, USA) Meyer
Publisher: Routledge
No Review Yet
AED492
Binding:
Hardback
Release:
30 Jun 2014
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Applied Measurement with jMetrik
Applied Measurement with jMetrik
By: J Patrick Meyer, J. Patrick (University of Virginia, USA) Meyer
Publisher: Routledge
No Review Yet
AED245
Binding:
Paperback
Release:
30 Jun 2014
Language:
English
International Edition
Ships within 18-20 Days Explain..
3.
Understanding Measurement: Reliability
Understanding Measurement: Reliability
By: Patrick Meyer, J Patrick Meyer
Publisher: Oxford University Press, USA
No Review Yet
AED166
Binding:
Paperback
Release:
30 Apr 2010
Language:
English
International Edition
Ships within 14-16 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
No more records found