j. patrick (university of virginia, usa) meyer author - Books - 24x7 online bookstore Bookswagon.ae

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Flat 10% Off Upto 10AED - Use Code FLAT10

Purchase Any Book And Get 5AED Off - Use Code FIRST

Flat 10% Off Upto 10AED - Use Code FLAT10

Purchase Any Book And Get 5AED Off - Use Code FIRST

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1.
Applied Measurement with jMetrik
Applied Measurement with jMetrik
By: J Patrick Meyer, J. Patrick (University of Virginia, USA) Meyer
Publisher: Routledge
No Review Yet
AED492
Binding:
Hardback
Release:
30 Jun 2014
Language:
English
Available
Ships within 12-14 Days Explain..
2.
Applied Measurement with jMetrik
Applied Measurement with jMetrik
By: J Patrick Meyer, J. Patrick (University of Virginia, USA) Meyer
Publisher: Routledge
No Review Yet
AED245
Binding:
Paperback
Release:
30 Jun 2014
Language:
English
International Edition
Ships within 18-20 Days Explain..
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