Books written by J. Patrick (University of Virginia, USA) Meyer
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J. Patrick (University of Virginia, USA) Meyer

J. Patrick (University of Virginia, USA) Meyer

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1.
Applied Measurement with jMetrik
Publisher: Routledge
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AED492
Binding:
Hardback
Release:
30 Jun 2014
Language:
English
Available
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2.
Applied Measurement with jMetrik
Publisher: Routledge
No Review Yet
AED253
Binding:
Paperback
Release:
30 Jun 2014
Language:
English
International Edition
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