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1.
Advances in X-Ray Analysis
Advances in X-Ray Analysis
By: Deane K. Smith, John V. Gilfrich, Robert L. Snyder, Ron Jenkins, Ting C. Huang
Publisher: Springer Science+Business Media
No Review Yet
AED1,325
Binding:
Hardback
Release:
31 Jan 1998
Language:
English
International Edition
Ships within 14-16 Days Explain..
2.
Advances in X-Ray Analysis
Advances in X-Ray Analysis
By: Deane K. Smith, John V. Gilfrich, Ron Jenkins, Ting C. Huang, C.C. Goldsmith
Publisher: Springer Science+Business Media
No Review Yet
AED1,324
Binding:
Hardback
Release:
30 Sep 1995
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
Advances in X-Ray Analysis
Advances in X-Ray Analysis
By: M.R. James, C.R. Hubbard, Deane K. Smith, G.R. Lachance, John V. Gilfrich
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED264
Binding:
Paperback
Release:
24 Oct 2012
Language:
English
International Edition
Ships within 14-16 Days Explain..
4.
Advances in X-Ray Analysis
Advances in X-Ray Analysis
By: Charles S. Barrett, John V. Gilfrich, Ron Jenkins, Ting C. Huang
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED170
Binding:
Paperback
Release:
02 Jun 2012
Language:
English
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