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1.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, John Henry Scott, Joseph R. Michael, Joseph Goldstein, Joseph I. Goldstein
Publisher: Springer
5.0 (1)
AED761
Binding:
Hardback
Release:
18 Nov 2017
Language:
English
Available
Ships within 10-12 Days Explain..
Free Shipping in UAE.
2.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Dale E. Newbury, Joseph R. Michael, Joseph I. Goldstein, David C. Joy, David C Joy
Publisher: Springer New York
No Review Yet
AED742
Binding:
Paperback
Release:
30 Aug 2018
Language:
English
Available
Ships within 10-12 Days Explain..
Free Shipping in UAE.
3.
X-Ray Spectrometry in Electron Beam Instruments
X-Ray Spectrometry in Electron Beam Instruments
By: Dale E. Newbury, David B Williams, Joseph Goldstein, Joseph I. Goldstein, David B. Williams
Publisher: Springer
No Review Yet
AED2,196
Binding:
Paperback
Release:
21 Oct 2012
Language:
English
International Edition
Ships within 32-34 Days Explain..
Free Shipping in UAE.
4.
Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and X-Ray Microanalysis
By: Newbury Dale E. Newbury, Goldstein Joseph I. Goldstein, Michael Joseph R. Michael
Publisher: Springer Nature B.V.
No Review Yet
AED481
Binding:
Paperback
Release:
18 Nov 2017
Language:
English
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