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1.
Low-Power High-Resolution Analog to Digital Converters
Low-Power High-Resolution Analog to Digital Converters
By: Amir Zjajo, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
AED243
Binding:
Hardback
Release:
05 Nov 2010
Language:
English
International Edition
Ships within 14-16 Days Explain..
2.
Low-Power High-Resolution Analog to Digital Converters
Low-Power High-Resolution Analog to Digital Converters
By: Amir Zjajo, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
AED242
Binding:
Paperback
Release:
23 Aug 2016
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
By: Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
AED455
Binding:
Paperback
Release:
23 Feb 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
4.
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
Integrated Circuit Defect-Sensitivity: Theory and Computational Models
By: Gary Saul Morson, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
AED253
Binding:
Hardback
Release:
31 Dec 1992
Language:
English
Available
Ships within 4-6 Days Explain..
5.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
AED897
Binding:
Hardback
Release:
21 Jun 2007
Language:
English
International Edition
Ships within 14-16 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
6.
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
By: Manoj Sachdev, Jose Pineda de Gyvez, José Pineda de Gyvez
Publisher: Springer
No Review Yet
AED654
Binding:
Paperback
Release:
10 Nov 2010
Language:
English
International Edition
Ships within 14-16 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
7.
Integrated Circuit Manufacturability
Integrated Circuit Manufacturability
By: Dhiraj Pradham, Dhiraj Pradhan, Jose Pineda de Gyvez, José Pineda de Gyvez, de Gyvez
Publisher: Wiley-IEEE Press
No Review Yet
AED574
Binding:
Hardback
Release:
30 Oct 1998
Language:
English
Available
Ships within 4-6 Days Explain..
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