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1.
High Resolution Focused Ion Beams: FIB and its Applications
High Resolution Focused Ion Beams: FIB and its Applications
By: Jon Orloff, Lynwood Swanson, Mark Utlaut
Publisher: Springer-Verlag New York Inc.
No Review Yet
AED955
Binding:
Paperback
Release:
20 Sep 2012
Language:
English
International Edition
Ships within 16-18 Days Explain..
2.
Computer Processing of Electron Microscope Images
Computer Processing of Electron Microscope Images
By: Peter W. Hawkes, Mark Utlaut, J. Frank, W. Hoppe, D. Kopf
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
AED368
Binding:
Hardback
Release:
01 Jan 1980
Language:
English
Out of Stock
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3.
High Resolution Focused Ion Beams: FIB and its Applications
High Resolution Focused Ion Beams: FIB and its Applications
By: Jon Orloff, Lynwood Swanson, Mark Utlaut
Publisher: Springer Science+Business Media
No Review Yet
AED915
Binding:
Hardback
Release:
31 Oct 2002
Language:
English
Out of Stock
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4.
High Resolution Focused Ion Beams
High Resolution Focused Ion Beams
By: Jon Orloff, Lynwood Swanson, Mark Utlaut
Publisher: Springer My Copy UK
No Review Yet
AED105
Binding:
Paperback
Release:
31 Oct 2002
Out of Stock
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