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Mohab Anis

Mohab Anis

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Design for Yield and Reliability for Nanometer CMOS Digital Circuits
Design for Yield and Reliability for Nanometer CMOS Digital Circuits
By: Anis Mohab, Elmasry Mohamed, Mostafa Hassan
Publisher: Lap Lambert Academic Publishing
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AED555
Binding:
Paperback
Release:
26 Jan 2014
Language:
English
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