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Flat 10% Off Upto 10AED - Use Code FLAT10

Purchase Any Book And Get 5AED Off - Use Code FIRST

Flat 10% Off Upto 10AED - Use Code FLAT10

Purchase Any Book And Get 5AED Off - Use Code FIRST

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1.
System-On-Chip Test Architectures
System-On-Chip Test Architectures
By: Laung-Terng Wang, Charles E. Stroud, Nur Touba, Charles E Stroud, Nur A Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED688
Binding:
Hardback
Release:
01 Nov 2007
Language:
English
International Edition
Ships within 26-28 Days Explain..
Free Shipping in UAE.
2.
VLSI Test Principles and Architectures
VLSI Test Principles and Architectures
By: Charles Stroud, Benoit Nadeau-Dostie, Abhijit Chatterjee, Laung-Terng Wang, Nur Touba
Publisher: Morgan Kaufmann Publishers
No Review Yet
AED728
Binding:
Hardback
Release:
01 Jun 2006
Language:
English
International Edition
Ships within 26-28 Days Explain..
Free Shipping in UAE.
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