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Paul R Yost

Paul R Yost

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1.
Real Time Leadership Development
Real Time Leadership Development
By: Paul R. Yost, Mary Mannion Plunkett, Yost, Paul R Yost
Publisher: Wiley-Blackwell
No Review Yet
AED900
Binding:
Hardback
Release:
26 May 2009
Language:
English
International Edition
Ships within 22-24 Days Explain..
Free Shipping in UAE.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
2.
Real Time Leadership Development
Real Time Leadership Development
By: Paul R. Yost, Mary Mannion Plunkett, Paul R Yost, P Yost
Publisher: Wiley-Blackwell
No Review Yet
AED320
Binding:
Paperback
Release:
01 May 2009
Language:
English
International Edition
Ships within 22-24 Days Explain..
Free Shipping in UAE.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Experience-Driven Leader Development
Experience-Driven Leader Development
By: Paul R. Yost, Sylvester Taylor, Cynthia D. McCauley, D. Scott Derue, Cynthia D McCauley
Publisher: Jossey-Bass
3.0 (1)
AED967
Binding:
Hardback
Release:
25 Nov 2013
Language:
English
International Edition
Ships within 22-24 Days Explain..
Free Shipping in UAE.
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
4.
Materials Reliability Issues in Microelectronics: Volume 225
Materials Reliability Issues in Microelectronics: Volume 225
By: James R. Lloyd, Paul S. (IBM T J Watson Research Center, New York) Ho, Frederick G. Yost, James R Lloyd, Paul S Ho
Publisher: Cambridge University Press
No Review Yet
AED298
Binding:
Hardback
Release:
22 Oct 1991
Language:
English
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