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1.
Electromigration in Metals
Electromigration in Metals
By: Valeriy Sukharev, Martin Gall, Paul S. (University of Texas, Austin) Ho, Paul S Ho, Chao-Kun Hu
Publisher: Cambridge University Press
No Review Yet
AED370
Binding:
Hardback
Release:
12 May 2022
Language:
English
International Edition
Ships within 18-20 Days Explain..
2.
Low Dielectric Constant Materials for IC Applications
Low Dielectric Constant Materials for IC Applications
By: Paul S. Ho, Wei William Lee, Jihperng Leu, Paul S Ho
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
AED677
Binding:
Paperback
Release:
04 Oct 2012
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Eduard Arzt, Paul S Ho, Shefford P Baker, Matti A Korhonen
Publisher: American Institute of Physics
No Review Yet
AED84
Binding:
Hardback
Release:
09 Apr 2002
Language:
English
Available
Ships within 1-2 Days Explain..
4.
Low Dielectric Constant Materials for IC Applications
Low Dielectric Constant Materials for IC Applications
By: W. W. Lee, P. S. Ho, Paul S. Ho, Wei William Lee, Jihperng Leu
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
No Review Yet
AED678
Binding:
Hardback
Release:
14 Nov 2002
Language:
English
International Edition
Ships within 14-16 Days Explain..
5.
Materials Reliability in Microelectronics III: Volume 309
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
No Review Yet
AED107
Available
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6.
Materials Reliability in Microelectronics III: Volume 309
Materials Reliability in Microelectronics III: Volume 309
By: William F. Filter, Paul S. (University of Texas, Austin) Ho, Harold J. (Dartmouth College, New Hampshire) Frost, Harold J Frost, Kenneth P Rodbell
Publisher: Cambridge University Press
No Review Yet
AED141
Binding:
Paperback
Release:
05 Jun 2014
Language:
English
International Edition
Ships within 14-16 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
7.
Advanced Interconnects for ULSI Technology
Advanced Interconnects for ULSI Technology
By: Mikhail Baklanov, Ehrenfried Zschech, Mikhail R. Baklanov, Paul S. Ho, Paul S Ho
Publisher: Wiley
No Review Yet
AED639
Binding:
Hardback
Release:
02 Apr 2012
Language:
English
Available
Ships within 1-2 Days Explain..
8.
Electronic Packaging Materials Science V: Volume 203
Electronic Packaging Materials Science V: Volume 203
By: Paul S. Ho, Edwin D. Lillie, Ralph Jaccodine, Kenneth Jackson, Ralph J. Jaccodine
Publisher: Cambridge University Press
No Review Yet
AED118
Binding:
Hardback
Release:
07 Jun 1991
Language:
English
Out of Stock
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9.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Paul Totta, Paul Tuha, Che-Yu Li, C y Li, Paul S Ho
Publisher: American Institute of Physics
No Review Yet
AED529
Binding:
Hardback
Release:
14 Apr 2000
Language:
English
Out of Stock
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10.
Materials Reliability Issues in Microelectronics: Volume 225
Materials Reliability Issues in Microelectronics: Volume 225
By: James R. Lloyd, Paul S. (IBM T J Watson Research Center, New York) Ho, Frederick G. Yost, James R Lloyd, Paul S Ho
Publisher: Cambridge University Press
No Review Yet
AED128
Binding:
Hardback
Release:
22 Oct 1991
Language:
English
Out of Stock
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11.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: John Sanchez, Che-Yu Li, John Bravman, Paul S Ho
Publisher: American Institute of Physics
No Review Yet
AED613
Binding:
Hardback
Release:
15 Apr 1998
Language:
English
Out of Stock
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12.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Tomoji Nakamura, Cynthia A Volkert, Paul S Ho, Shefford P Baker
Publisher: American Institute of Physics
No Review Yet
AED596
Binding:
Hardback
Release:
01 Dec 2004
Language:
English
Out of Stock
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13.
Stress-Induced Phenomena in Metallization
Stress-Induced Phenomena in Metallization
By: Ehrenfried Zschech, Shinichi Ogawa, Paul S Ho
Publisher: American Institute of Physics
No Review Yet
AED143
Binding:
Hardback
Release:
01 Jun 2009
Language:
English
Out of Stock
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14.
Electronic Packaging Materials Science VI: Volume 264
Electronic Packaging Materials Science VI: Volume 264
By: Che-Yu Li, Che-Yu (Cornell University, New York) Li, Paul S. (University of Texas, Austin) Ho, Kenneth A. (University of Arizona) Jackson, G. Ferris Lipscomb
Publisher: Materials Research Society
No Review Yet
AED104
Binding:
Hardback
Release:
12 Nov 1992
Language:
English
Out of Stock
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