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1.
Applications et metrologie a l'echelle nanometrique 1: materiaux intelligents, onde electromagnetique et incertitudes
Applications et metrologie a l'echelle nanometrique 1: materiaux intelligents, onde electromagnetique et incertitudes
By: Dahoo, Pierre Richard, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED423
Binding:
Paperback
Release:
12/1/2021
Language:
French
International Edition
Ships within 18-20 Days Explain..
2.
Applications et metrologie a l'echelle nanometrique 2: systemes de mesure, ingenierie quantique et methodes d'optimisation fiabiliste
Applications et metrologie a l'echelle nanometrique 2: systemes de mesure, ingenierie quantique et methodes d'optimisation fiabiliste
By: Dahoo, Pierre Richard, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED423
Binding:
Paperback
Release:
12/1/2021
Language:
French
International Edition
Ships within 18-20 Days Explain..
3.
Applications and Metrology at Nanometer-Scale 2
Applications and Metrology at Nanometer-Scale 2
By: Pierre Richard Dahoo, Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet, PR Dahoo
Publisher: Wiley
No Review Yet
AED524
Binding:
Hardback
Release:
04 May 2021
Language:
English
Available
Ships within 12-14 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
4.
Applications and Metrology at Nanometer Scale 1
Applications and Metrology at Nanometer Scale 1
By: Pierre Richard Dahoo, Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet, PR Dahoo
Publisher: Wiley
No Review Yet
AED524
Binding:
Hardback
Release:
16 Mar 2021
Language:
English
Available
Ships within 12-14 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
5.
Embedded Mechatronic Systems 2
Embedded Mechatronic Systems 2
By: Abdelkhalak El Hami, Philippe Pougnet, Abdelkhalak (Institut National des Sciences Appliquees (INSA-Rouen), France) El Hami, Abdelkhalak (Professor, INSA Rouen, France) El Hami, Philippe (Reliability Expert, Valeo, Paris, France) Pougnet
Publisher: Iste Press - Elsevier
No Review Yet
AED349
Binding:
Hardback
Release:
03 Mar 2020
Language:
English
International Edition
Ships within 18-20 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
6.
Les systemes mecatroniques embarques 1: Analyse des causes de defaillances, fiabilite et contraintes - 2e edition revue et augmentee
Les systemes mecatroniques embarques 1: Analyse des causes de defaillances, fiabilite et contraintes - 2e edition revue et augmentee
By: Hami, Abdelkhalak El, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED401
Binding:
Paperback
Release:
1/31/2020
Language:
French
International Edition
Ships within 18-20 Days Explain..
7.
Les systemes mecatroniques embarques 2: Analyse des causes de defaillances, modelisation, simulation et optimisation - 2e edition revue et augmentee
Les systemes mecatroniques embarques 2: Analyse des causes de defaillances, modelisation, simulation et optimisation - 2e edition revue et augmentee
By: Hami, Abdelkhalak El, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED406
Binding:
Paperback
Release:
1/31/2020
Language:
French
International Edition
Ships within 18-20 Days Explain..
8.
Embedded Mechatronic Systems
Embedded Mechatronic Systems
By: Abdelkhalak El Hami, Philippe Pougnet, Abdelkhalak (Institut National des Sciences Appliquees (INSA-Rouen), France) El Hami, Philippe (Reliability Expert, Valeo, Paris, France) Pougnet, Philippe (VeDeCom, Valeo, Paris, France) Pougnet
Publisher: Elsevier Science
No Review Yet
AED349
Binding:
Hardback
Release:
15 Nov 2019
Language:
English
International Edition
Ships within 18-20 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
9.
Embedded Mechatronic Systems, Volume 1
Embedded Mechatronic Systems, Volume 1
By: Abdelkhalak El Hami, Philippe Pougnet, Abdelkhalak (Institut National des Sciences Appliquees (INSA-Rouen), France) El Hami, Philippe (VeDeCom, Valeo, Paris, France) Pougnet
Publisher: Iste Press - Elsevier
No Review Yet
AED401
Binding:
Hardback
Release:
16 Jul 2015
Language:
English
Available
Ships within 2-4 Days Explain..
10.
Embedded Mechatronic Systems, Volume 2
Embedded Mechatronic Systems, Volume 2
By: Abdelkhalak El Hami, Philippe Pougnet, Abdelkhalak (Professor, INSA Rouen, France) El Hami, Philippe (Reliability Expert, Valeo, Paris, France) Pougnet
Publisher: Iste Press - Elsevier
No Review Yet
AED401
Binding:
Hardback
Release:
16 Jul 2015
Language:
English
Available
Ships within 2-4 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
11.
Nanometer-Scale Defect Detection Using Polarized Light
Nanometer-Scale Defect Detection Using Polarized Light
By: Pierre-Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet, PR Dahoo
Publisher: Wiley-Iste
No Review Yet
AED672
Binding:
Hardback
Release:
22 Aug 2016
Language:
English
International Edition
Ships within 24-26 Days Explain..
12.
Defauts a l'echelle nanometrique en lumiere polarisee
Defauts a l'echelle nanometrique en lumiere polarisee
By: Dahoo, Pierre Richard, Pougnet, Philippe
Publisher: Hermes Science Publishing Ltd
No Review Yet
AED12
Binding:
Paperback
Release:
7/31/2016
Language:
French
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