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Robert M. Seiler

Robert M. Seiler

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1.
Characterization and Metrology for ULSI Technology 2005
Publisher: Springer
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AED2,931
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
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2.
Reel Time
Publisher: UBC Press
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AED338
Binding:
Paperback
Release:
01 Dec 2012
Language:
English
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3.
Frontiers of Characterization and Metrology for Nanoelectronics
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AED1,855
Binding:
Mixed media product
Release:
01 Sep 2007
Language:
English
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4.
Characterization and Metrology for ULSI Technology
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AED2,182
Binding:
Mixed media product
Release:
08 Oct 2003
Language:
English
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5.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
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