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1.
Characterization and Metrology for ULSI Technology 2005
Characterization and Metrology for ULSI Technology 2005
By: Stefan Zollner, Robert McDonald, David G Seiler, D G Seiler, Alain C Diebold
Publisher: Springer
No Review Yet
AED2,931
Binding:
Hardback
Release:
01 Sep 2005
Language:
English
Out of Stock
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2.
Reel Time
Reel Time
By: Robert M Seiler, Robert M. Seiler, Tamara P. Seiler
Publisher: UBC Press
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AED338
Binding:
Paperback
Release:
01 Dec 2012
Language:
English
Out of Stock
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3.
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
Frontiers of Characterization and Metrology for Nanoelectronics: 2011
By: Amal Chabli, Robert McDonald, David G Seiler, Alain C Diebold, Erik M Secula
Publisher: American Institute of Physics
No Review Yet
AED1,920
Binding:
Book
Release:
26 Apr 2012
Language:
English
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