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Stanley J Ness

Stanley J Ness

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Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
Stress Analysis of Silicon Carbide Microelectromechanical Systems Using Raman Spectroscopy
By: Stanley J Ness
Publisher: Biblioscholar
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AED518
Binding:
Paperback
Release:
01 Oct 2012
Language:
English
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