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Valdre Ugo Valdre

Valdre Ugo Valdre

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1.
Surface and Interface Characterization by Electron Optical Methods
Surface and Interface Characterization by Electron Optical Methods
By: Ugo Valdre
Publisher: Springer
No Review Yet
AED251
Binding:
Paperback
Release:
25 Nov 2012
Language:
English
International Edition
Ships within 24-26 Days Explain..
2.
Impact of Electron and Scanning Probe Microscopy on Materials Research
Impact of Electron and Scanning Probe Microscopy on Materials Research
By: David G. Rickerby, Giovanni Valdre, Ugo Valdre, David G Rickerby, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy) Valdre
Publisher: Springer
No Review Yet
AED462
Binding:
Hardback
Release:
31 Oct 1999
Language:
English
International Edition
Ships within 14-16 Days Explain..
3.
Impact of Electron and Scanning Probe Microscopy on Materials Research
Impact of Electron and Scanning Probe Microscopy on Materials Research
By: David G. Rickerby, Giovanni Valdre, Ugo Valdre, David G Rickerby, Giovanni (Dept. of Earth and Geo-Environmental Sciences, University of Bologna, Italy) Valdre
Publisher: Springer
No Review Yet
AED462
Binding:
Paperback
Release:
30 Sep 1999
Language:
English
International Edition
Ships within 14-16 Days Explain..
4.
Surface and Interface Characterization by Electron Optical Methods
Surface and Interface Characterization by Electron Optical Methods
By: Valdre Ugo Valdre
Publisher: Springer Nature B.V.
No Review Yet
AED206
Binding:
Paperback
Release:
13 Feb 2014
Language:
English
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