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1.
VLSI Design for Manufacturing: Yield Enhancement
VLSI Design for Manufacturing: Yield Enhancement
By: Robin Davidson, Wojciech Maly, Ewa Lipska, Stephen W Director, Andrzej J Strojwas
Publisher: Springer
No Review Yet
AED678
Binding:
Hardback
Release:
30 Nov 1989
Language:
English
International Edition
Ships within 14-16 Days Explain..
2.
From Contamination to Defects, Faults and Yield Loss
From Contamination to Defects, Faults and Yield Loss
By: Jitendra B. Khare, Wojciech Maly, Jitendra B Khare
Publisher: Springer
No Review Yet
AED467
Binding:
Paperback
Release:
26 Sep 2011
Language:
English
International Edition
Ships within 24-26 Days Explain..
3.
VLSI Design for Manufacturing: Yield Enhancement
VLSI Design for Manufacturing: Yield Enhancement
By: Andrzej J. Strojwas, Wojciech Maly, Stephen W. Director, Stephen W Director, Andrzej J Strojwas
Publisher: Springer
No Review Yet
AED677
Binding:
Paperback
Release:
21 Sep 2011
Language:
English
International Edition
Ships within 14-16 Days Explain..
4.
From Contamination to Defects, Faults and Yield Loss
From Contamination to Defects, Faults and Yield Loss
By: Feng-Hsiung Hsu, Jitendra B. Khare, Wojciech Maly, Jon Kleinberg, Jitendra B Khare
Publisher: Springer
No Review Yet
AED268
Binding:
Hardback
Release:
30 Apr 1996
Language:
English
Available
Ships within 1-2 Days Explain..
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