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Yervant Zorian

Yervant Zorian

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1.
Multi-Chip Module Test Strategies
Multi-Chip Module Test Strategies
By: Yervant Zorian
Publisher: Springer
No Review Yet
AED497
Binding:
Hardback
Release:
31 May 1997
Language:
English
International Edition
Ships within 14-16 Days Explain..
2.
Principles of Testing Electronic Systems
Principles of Testing Electronic Systems
By: Samiha Mourad, Yervant Zorian, Zorian, Mourad, S Mourad
Publisher: Wiley-Interscience
No Review Yet
AED691
Binding:
Hardback
Release:
25 Jul 2000
Language:
English
International Edition
Ships within 14-16 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
3.
Embedded Processor-Based Self-Test
Embedded Processor-Based Self-Test
By: Dimitris Gizopoulos, Yervant Zorian, A Paschalis
Publisher: Springer
No Review Yet
AED812
Binding:
Hardback
Release:
01 Dec 2004
Language:
English
International Edition
Ships within 14-16 Days Explain..
Print On Demand
Print On Demand (POD) titles : are those which have been especially printed by the Publisher / Vendor partner only after an order for them has been received. They are also classified as Non-Returnable.
Non-Returnable titles : are those which have been classified as Non-Returnable under any circumstance by International Publishers / Vendor partners.
4.
Embedded Processor-Based Self-Test
Embedded Processor-Based Self-Test
By: Dimitris Gizopoulos, Yervant Zorian, A Paschalis
Publisher: Springer
No Review Yet
AED717
Binding:
Paperback
Release:
14 Dec 2011
Language:
English
International Edition
Ships within 14-16 Days Explain..
5.
Collaboration and Technology
Collaboration and Technology
By: Nelson Baloian, Perouz Taslakian, Yervant Zorian, Samvel Shoukouryan
Publisher: Springer
No Review Yet
AED234
Binding:
Paperback
Release:
27 Aug 2015
Language:
English
International Edition
Ships within 14-16 Days Explain..
6.
On-Line Testing for VLSI
On-Line Testing for VLSI
By: Michael Nicolaidis, Dhiraj Pradhan, Dhiraj K. Pradhan, Yervant Zorian
Publisher: Springer
No Review Yet
AED497
Binding:
Hardback
Release:
30 Apr 1998
Language:
English
International Edition
Ships within 14-16 Days Explain..
7.
On-Line Testing for VLSI
On-Line Testing for VLSI
By: Michael Nicolaidis, Dhiraj Pradhan, Dhiraj K. Pradhan, Yervant Zorian
Publisher: Springer
No Review Yet
AED502
Binding:
Paperback
Release:
06 Dec 2010
Language:
English
International Edition
Ships within 14-16 Days Explain..
8.
Multi-Chip Module Test Strategies
Multi-Chip Module Test Strategies
By: Yervant Zorian
Publisher: Springer
No Review Yet
AED322
Binding:
Paperback
Release:
04 Oct 2012
Language:
English
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