Forces in Scanning Probe Methods
Home > Mathematics and Science Textbooks > Physics > Materials / States of matter > Condensed matter physics > Forces in Scanning Probe Methods
Forces in Scanning Probe Methods

Forces in Scanning Probe Methods

|
     0     
5
4
3
2
1




International Edition


About the Book

This volume contains the proceedin,r. of the NATO Advanced Study Institute on "Forces in Scanning Probe Methods which was CG-sponsered and organized by the "Forum fUr N anowissenschaften". The conference was held in Schluchsee in the south- em Black Forest (Germany) from March 7-18, 1994. 30 invited lecturers giving tuto- rial talks of historical and recent research activities and about 100 contributed, oral and poster presentations from 130 people participating, created a very active and lestimulating, lively atmosphere. The inventions of scanning tunneling microscopy, atomic force microscopy and near field optical microsocopy opened a new field of research, called scanning probe meth- ods (SPM). During the last decade, the quality of image acquisition made tremendous progress due to advanced data acquisition systems, low noise electronics and suitable mechan- ical and micromechanical constructions. However, a lot of fundamental, unsolved questions about the interaction between probing tip and sample remain. This vol- ume contains 60 contributions dedicated to these problems. Most of the articles are review articles presenting. condensed and relevant information in a way suitable for both students and specialists. Topics that are covered are instrumental aspects, de- signs of force microscopes in various environments, such as ambient pressure, low temperature, ultrahip vacuum and liquids. An important part of the workshop was dedicated to theory, Including all initio calculations and molecular dynamics simula- tions. Mechanical properties, such as adhesion, friction and wear, on the micrometer and nanometer scale were also treated intensively.

Table of Contents:
to Scanning Probe Methods.- The Nanometer Age: Challenge and Chance.- Instrumentation.- Scanning Probe Microscopy Instrumentation.- Low Temperature Scanning Force Microscopy.- Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope.- Oscillating String as a Force Sensor in Scanning Force Microscopy.- Electrostatically Actuated Silicon Micromachined Sensors for Scanning Force Microscopy.- Effect of Overlayer Thickness on the Nanoindentation of SiO2 /Si.- Nanostethoscopy: a New Mode of Operation of the Atomic Force Microscope.- A Multi-Test Instrument Based on Scanning Probe Technologies.- Hydrophobic Surface Interactions Studied Using a Novel Force Microscope.- Imaging Loal Electric Forces in Organic Thin Films by Scanning Maxwell Stress Microscopy.- Simultaneous AFM and Local Conductivity Imaging.- Micromechanical Heat Sensor: Observation of a Chemical Reaction, Photon and Electrical Heat Pulses.- Theory.- Forces in Scanning Probe Microscopy.- Controlled Motion of Xe Atom on Metal Surfaces.- Van der Waals Forces and Probe Geometeries for Some Specific Scanning Force Microscopy Studies.- Atomistic Theory of the Interaction between AFM Tips and Ionic Surfaces.- Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation, Friction, and Modification of Diamond Surfaces.- Simulation of SFM Images of Adsorbed C60 and C70 Molecule.- Metallic Adhesion.- Atomic-Scale Metal Adhesion.- Photons.- Photons and Forces I: Light Generates Force.- Photons and Forces II: Forces Influence Light.- Friction.- Interfacial Friction and Adhesion of Wetted Monolayers.- Coherent Phonon Generation in the Process of Friction.- Friction Force Microscopy.- Molecular Scale Study of Domain Boundaries and Frictional Stick-Slip Motion on Lipid Bilayers.- Two-Dimensional Atomic-ScaleFriction Observed with an AFM.- Normal and Lateral Forces in Friction Force Microscopy.- Nanotribology and Chemical Sensitivity on a Nanometer Scale.- Lateral Force Measurements on Phase Separated Polymer Surfaces.- Friction and Load on Well Defined Surfaces Studied by Atomic Force Microscopy.- Friction on an Atomic Scale.- Nano and Micromechanics.- Nanomechanics: Atomic Resolution and Frictional Energy Dissipation in Atomic Force Microscopy.- Nanotribology and its Applications to Magnetic Storage Devices and MEMS.- Lifetime Criteria of Macro- and Microtribological Systems.- Mechanical Property Evaluations of Solid Surfaces as a Technological Application of SPM.- Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel Tribological Junctions Studied with the Atomic Force Microscope.- Magnetic Storage and Magnetic Forces.- High-Density Recording Technologies as an Application of SPM.- Applications of Magnetic Force Microscopy.- Magnetic Force Microscopy on Thin Film Magnetic Recording Media.- Analysis of Vortices in Superconductors by Scanning Probe Microscopy.- Applications.- Understanding Surface Chemical Processes in Environmental Contamination: New Applications for AFM.- Force Microscopy of Heavy Ion Irradiated Materials.- Atomic Force Microscopy as a Tool to Study Surface Roughness Effects In X-Ray Photoelectron Spectroscopy.- Atomic-Resolution Image of GaAs (110) Surface with an Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM).- Time dependence and its Spatial Distribution of Densely Contact-Electrified Electrons on a Thin Silicon Oxide.- Giant Atomic Corrugations on Layered Dichalcogenides Investigated by AFM/LFM.- Nanometer Scale Machining of Covalent Monolayers Investigated by Combined AFM/ LFM.- Atomic Resolution Imaging of ReS2 by AFM/LFM.- Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model Catalysts.- AFM in Liquids AFM Observations of Si (111) in Solutions.- Atomic Scale Force Mapping with the Atomic Force Microscope.- Organics and Biology.- Imaging Chemical Bonds by SPM.- Study of Thin Organic Films by Various Scanning Force Microscopes.- Molecular Arrangement and Mechanical Stability of Self-Assembled Monolayers on Au (111) under Applied Load.- Organic Interface Inspection by Scanning Force Microscopy.- Atomic Force Microscopy of Biological Membranes: Current Possibilities and Prospects.- Biomolecule Photoimmobilization: Application in Scanning Probe Microscopy.- Measuring Molecular Adhesion with Force Microscopy.- Author-index.- Subject-index.


Best Sellers


Product Details
  • ISBN-13: 9780792334064
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Height: 235 mm
  • No of Pages: 644
  • Returnable: N
  • ISBN-10: 079233406X
  • Publisher Date: 31 Mar 1995
  • Binding: Hardback
  • Language: English
  • Returnable: Y
  • Width: 155 mm


Similar Products

Add Photo
Add Photo

Customer Reviews

REVIEWS      0     
Click Here To Be The First to Review this Product
Forces in Scanning Probe Methods
Springer -
Forces in Scanning Probe Methods
Writing guidlines
We want to publish your review, so please:
  • keep your review on the product. Review's that defame author's character will be rejected.
  • Keep your review focused on the product.
  • Avoid writing about customer service. contact us instead if you have issue requiring immediate attention.
  • Refrain from mentioning competitors or the specific price you paid for the product.
  • Do not include any personally identifiable information, such as full names.

Forces in Scanning Probe Methods

Required fields are marked with *

Review Title*
Review
    Add Photo Add up to 6 photos
    Would you recommend this product to a friend?
    Tag this Book Read more
    Does your review contain spoilers?
    What type of reader best describes you?
    I agree to the terms & conditions
    You may receive emails regarding this submission. Any emails will include the ability to opt-out of future communications.

    CUSTOMER RATINGS AND REVIEWS AND QUESTIONS AND ANSWERS TERMS OF USE

    These Terms of Use govern your conduct associated with the Customer Ratings and Reviews and/or Questions and Answers service offered by Bookswagon (the "CRR Service").


    By submitting any content to Bookswagon, you guarantee that:
    • You are the sole author and owner of the intellectual property rights in the content;
    • All "moral rights" that you may have in such content have been voluntarily waived by you;
    • All content that you post is accurate;
    • You are at least 13 years old;
    • Use of the content you supply does not violate these Terms of Use and will not cause injury to any person or entity.
    You further agree that you may not submit any content:
    • That is known by you to be false, inaccurate or misleading;
    • That infringes any third party's copyright, patent, trademark, trade secret or other proprietary rights or rights of publicity or privacy;
    • That violates any law, statute, ordinance or regulation (including, but not limited to, those governing, consumer protection, unfair competition, anti-discrimination or false advertising);
    • That is, or may reasonably be considered to be, defamatory, libelous, hateful, racially or religiously biased or offensive, unlawfully threatening or unlawfully harassing to any individual, partnership or corporation;
    • For which you were compensated or granted any consideration by any unapproved third party;
    • That includes any information that references other websites, addresses, email addresses, contact information or phone numbers;
    • That contains any computer viruses, worms or other potentially damaging computer programs or files.
    You agree to indemnify and hold Bookswagon (and its officers, directors, agents, subsidiaries, joint ventures, employees and third-party service providers, including but not limited to Bazaarvoice, Inc.), harmless from all claims, demands, and damages (actual and consequential) of every kind and nature, known and unknown including reasonable attorneys' fees, arising out of a breach of your representations and warranties set forth above, or your violation of any law or the rights of a third party.


    For any content that you submit, you grant Bookswagon a perpetual, irrevocable, royalty-free, transferable right and license to use, copy, modify, delete in its entirety, adapt, publish, translate, create derivative works from and/or sell, transfer, and/or distribute such content and/or incorporate such content into any form, medium or technology throughout the world without compensation to you. Additionally,  Bookswagon may transfer or share any personal information that you submit with its third-party service providers, including but not limited to Bazaarvoice, Inc. in accordance with  Privacy Policy


    All content that you submit may be used at Bookswagon's sole discretion. Bookswagon reserves the right to change, condense, withhold publication, remove or delete any content on Bookswagon's website that Bookswagon deems, in its sole discretion, to violate the content guidelines or any other provision of these Terms of Use.  Bookswagon does not guarantee that you will have any recourse through Bookswagon to edit or delete any content you have submitted. Ratings and written comments are generally posted within two to four business days. However, Bookswagon reserves the right to remove or to refuse to post any submission to the extent authorized by law. You acknowledge that you, not Bookswagon, are responsible for the contents of your submission. None of the content that you submit shall be subject to any obligation of confidence on the part of Bookswagon, its agents, subsidiaries, affiliates, partners or third party service providers (including but not limited to Bazaarvoice, Inc.)and their respective directors, officers and employees.

    Accept

    New Arrivals

    Inspired by your browsing history


    Your review has been submitted!

    You've already reviewed this product!