Fringe 2005 Book by Wolfgang Osten - Bookswagon UAE
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Fringe 2005

Fringe 2005


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About the Book

Key Note.- Optical Measurement Techniques.- New Methods and Tools for Data Processing.- New Challenges for Optical Metrology: Evolution or Revolution.- Interpreting interferometric height measurements using the instrument transfer function.- Are Residues of Primary Importance in Phase Unwrapping?.- Experimental Study of Coherence Vortices: Birth and Evolution of Phase Singularities in the Spatial Coherence Function.- Properties of Isothetic Lines in Discontinuous Fields.- Heterodyne, quasi-heterodyne and after.- Robust three-dimensional phase unwrapping algorithm for phase contrast magnetic resonance velocity imaging.- Signal processing of interferogram using a two-dimensional discrete Hilbert transform.- Recent advances in automatic demodulation of single fringe patterns.- Comparison of Techniques for Fringe Pattern Background Evaluation.- Deformed surfaces in holographic Interferometry. Similar aspects concerning nonspherical gravitational fields.- Dynamic evaluation of fringe parameters by recurrence processing algorithms.- Fast hologram computation for holographic tweezers.- Wavelet analysis of speckle patterns with a temporal carrier.- Different preprocessing and wavelet transform based filtering techniques to improve Signal- to-noise ratio in DSPI fringes.- Wavefront Optimization using Piston Micro Mirror Arrays.- Adaptive Correction to the Speckle Correlation Fringes using twisted nematic LCD.- Random phase shift interferometer.- Spatial correlation function of the laser speckle field with holographic technique.- Fault detection from temporal unusualness in fringe patterns.- The Virtual Fringe Projection System (VFPS) and Neural Networks.- Fringe contrast enhancement using an interpolation technique.- Some remarks on accuracy of imaging polarimetry with carrier frequency.- Application of weighted smoothing splines to the local denoising of digital speckle pattern interferometry fringes.- Investigation of the fringe order in multi-component shearography surface strain measurement.- Metrological Fringe inpainting.- Combination of Digital Image Correlation Techniques and Spatial Phase Shifting Interferometry for 3D-Displacement Detection and Noise Reduction of Phase Difference Data.- Photoelastic tomography for birefringence determination in optical microelements.- Optimization of electronic speckle pattern interferometers.- Properties of phase shifting methods applied to time average interferometry of vibrating objects.- Depth-resolved displacement measurement using Tilt Scanning Speckle Interferometry.- New Phase Unwrapping Strategy for Rapid and Dense 3D Data Acquisition in Structured Light Approach.- Determination of modulation and background intensity by uncalibrated temporal phase stepping in a two-bucket spatially phase stepped speckle interferometer.- Resolution Enhanced Technologies.- EUVA's challenges toward 0.1nm accuracy in EUV at-wavelength interferometry.- Some similarities and dissimilarities of imaging simulation for optical microscopy and lithography.- A Ronchi-Shearing Interferometer for compaction test at a wavelength of 193nm.- Simulation and error budget for high precision interferometry.- Progress on the wide scale Nano-positioning and Nanomeasuring Machine by Integration of Optical-Nanoprobes.- Through-Focus Point-Spread Function Evaluation for Lens Metrology using the Extended Nijboer-Zernike Theory.- Digital Holographic Microscopy (DHM) applied to Optical Metrology: A resolution enhanced imaging technology applied to inspection of microscopic devices with subwavelength resolution.- An adaptive holographic interferometer for high precision measurements.- Spatio-Temporal Joint Transform Correlator and Fourier Domain OCT.- Subdivision of Nonlinearity in Heterodyne Interferometers.- Wide Scale 4D Optical Metrology.- Progress in SAR Interferometry.- New calibration procedure for measuring shape on specular surfaces.- Fringe Reflection for high resolution topometry and surface description on variable la


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Product Details
  • ISBN-13: 9783642065330
  • Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
  • Binding: Paperback
  • Height: 234 mm
  • No of Pages: 714
  • Series Title: English
  • Sub Title: The 5th International Workshop on Automatic Processing of Finge Patterns
  • Width: 156 mm
  • ISBN-10: 3642065333
  • Publisher Date: 12 Feb 2010
  • Edition: Softcover reprint of hardcover 1st ed. 2006
  • Language: English
  • Returnable: N
  • Spine Width: 37 mm
  • Weight: 1060 gr


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