A Guide to Noise in Microwave Circuits by Matthias Rudolph
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A Guide to Noise in Microwave Circuits

A Guide to Noise in Microwave Circuits


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About the Book

A GUIDE TO NOISE IN MICROWAVE CIRCUITS

A fulsome exploration of critical considerations in microwave circuit noise

In A Guide to Noise in Microwave Circuits: Devices, Circuits, and Measurement, a team of distinguished researchers deliver a comprehensive introduction to noise in microwave circuits, with a strong focus on noise characterization of devices and circuits. The book describes fluctuations beginning with their physical origin and touches on the general description of noise in linear and non-linear circuits.

Several chapters are devoted to the description of noise measurement -techniques and the interpretation of measured data. A full chapter is dedicated to noise sources as well, including thermal, shot, plasma, and current.

A Guide to Noise in Microwave Circuits offers examples of measurement problems--like low noise block (LNB) of satellite television - and explores equipment and measurement methods, like the Y, cold source, and 7-state method. This book also includes:

  • A thorough introduction to foundational terms in microwave circuit noise, including average values, amplitude distribution, autocorrelation, cross-correlation, and noise spectra
  • Comprehensive explorations of common noise sources, including thermal noise, the Nyquist formula and thermal radiation, shot noise, plasma noise, and more
  • Practical discussions of noise and linear networks, including narrowband noise
  • In-depth examinations of calculation methods for noise quantities, including noise voltages, currents, and spectra, the noise correlation matrix, and the noise of simple passive networks

Perfect for graduate students specializing in microwave and wireless electronics, A Guide to Noise in Microwave Circuits: Devices, Circuits, and Measurement will also earn a place in the libraries of professional engineers working in microwave or wireless circuits and system design.
About the Author:

Dr. Peter Heymann, retired, was the Head of the Microwave Measurement Laboratory at the Ferdinand-Braun-Institut (FBH), Leibniz-Institute for High Frequency Technology in Berlin, Germany.

Dr. Matthias Rudolph, is Ulrich L. Rohde Professor for RF and Microwave Techniques at Brandenburg University of Technology in Cottbus, Germany. He heads the Low-Noise components laboratory at the FBH.


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Product Details
  • ISBN-13: 9781119859369
  • Publisher: Wiley
  • Publisher Imprint: Wiley-IEEE Press
  • Height: 229 mm
  • No of Pages: 512
  • Spine Width: 29 mm
  • Weight: 902 gr
  • ISBN-10: 1119859360
  • Publisher Date: 22 Mar 2022
  • Binding: Hardback
  • Language: English
  • Returnable: N
  • Sub Title: Devices, Circuits and Measurement
  • Width: 152 mm


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