About the Book
Wer zuverlässige und aktuelle Informationen Ã1/4ber Metrologie sucht, wird hier fÃ1/4ndig: Rund 25 Beiträge in zwei Ã1/4bersichtlich organisierten Bänden widmen sich Grundlagen, Spezialgebieten (Metrologie in der Medizin) und Neuentwicklungen (Nanometrologie, Materialanalyse) gleichermaÃen ausfÃ1/4hrlich. Mit einem Glossar und vielen Literaturhinweisen.
About the Author: Editors: Manfred Kochsiek, former Vice President of PTB (German National Metrology Institute), and Michael Glaser, project leader in the Department of Technology Transfer.
Authors: F. Arias, BIPM, France. A. Bauch, PTB, Germany. J.H. Cantrell, U Tennessee, USA. S.M. Cristescu, Radboud University, The Netherlands. L. H. Czichos, BHT, Germany. R.S. Davies, BIPM, France. C. Fabjan, HEPHY, Austria. J. Fischer, PTB, Germany. J.L. Flowers, NPL, UK. E. Foerster, U Jena, Germany. C. Grupen, U Siegen, Germany. J.E. Hardy, Oak Ridge, USA. F.J.M. Harren, Radboud University, The Netherlands. M. Inguscio, LENS, Italy. B.P Kibble, NPL, UK. R. Macdonald, PTB, Germany. T.H. Markert, MIT, USA. S. Mieke, PTB, Germany. S. Persijn, NMI, The Netherlands. B.W. Petley, NPL, UK. F. Piquemal, LNE, France. K.A. Rubinson, Wright State U, USA. F.R. Ruppel, Alstom Power Inc., USA. G. Rusciano, U Neaples, Italy. A. Sasso, U Neaples, Italy. B.R.L. Siebert, PTB, Germany. K.D. Sommer, PTB, Germany. J. Stenger, PTB, Germany.