Preface. Acknowledgements.
1 Market and applications for NAND flash memories; Gregory Wong.
2 NAND overview: from memory to systems; R. Micheloni, A. Marelli and S. Commodaro.
3 Program and erase of NAND memory arrays; Cristoph Friederich.
4 Reliability issues of NAND flash memories; C. Zambelli, A. Chimenton and P. Olivo.
5 Charge trap NAND technologies; Alessandro Grossi.
6 Control logic; A. Marelli, R. Micheloni and R. Ravasio.
7 NAND DDR interface; Andrea Silvagni.
8 Sensing circuits; L. Crippa and R. Micheloni.
9 Parasitic effects and verify circuits; L. Crippa and R. Micheloni.
10 MLC storage; L. Crippa and R. Micheloni.
11 Charge pumps, voltage regulators and HV switches; R. Micheloni and L. Crippa.
12 High voltage overview; R. Micheloni and A. Marelli.
13 Redundancy; A. Marelli and R. Micheloni.
14 Error correction codes; T. Zhang, A. Marelli and R. Micheloni.
15 NAND design for testability and testing; Andrea Silvagni.
16 XLC storage; R. Micheloni and L. Crippa.
17 Flash cards; A. Ghilardelli and S. Corno.
18 Low power 3D-integrated SSD; K. Takeuchi.
19 Radiation effects on NAND Flash memories; M. Bagatin, G. Cellere, S. Gerardin and A. Paccagnella.
About the authors. Index.