Mems and Nanotechnology, Volume 5 by Barton C. Prorok
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Mems and Nanotechnology, Volume 5

Mems and Nanotechnology, Volume 5


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About the Book

Oxide Driven Strength Degradation of (1 1 1) Silicon Surfaces.- Keynote: In situ TEM Nanomechanical Testing.- Poisson's Ratio as a Damage Index Sensed By Dual-embedded Fiber Bragg Grating Sensor.- In Situ High-Rate Mechanical Testing in the Dynamic Transmission Electron Microscope.- In-situ TEM Observation of Twinning, Detwinning and Retwinning in Quartz.- Nano to Macro: Mechanical Evaluation of Macroscopically Long Individual Nanofibers.- Evaluating Pile-Up and Sink-In During Nanoindentation of Thin Films.- Tapered Cantilevered Bimorphs for Piezoelectric Energy Harvesting - Characterization With Impedance Spectroscopy.- Time and Temperature Dependence of Stress Relaxation in Al and Al Alloy Thin Films Application for MEMS.- Detecting Interconnect Damage in Shock Using Acoustic Emission Detection.- Application of Nanoindentation and Microdiffraction to Study Aging Effects in Lead Free Solder Interconnects.- High Rate Experimental Test Method for Harsh Environment Stretchable Electronics.- Measurement of the Electromechanical Response of Capacitors in Dynamic Loading Conditions.


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Product Details
  • ISBN-13: 9783319370439
  • Publisher: Springer International Publishing AG
  • Binding: Paperback
  • Height: 279 mm
  • No of Pages: 108
  • Series Title: Conference Proceedings of the Society for Experimental Mecha
  • Sub Title: Proceedings of the 2015 Annual Conference on Experimental and Applied Mechanics
  • Width: 210 mm
  • ISBN-10: 331937043X
  • Publisher Date: 23 Aug 2016
  • Edition: Softcover reprint of the original 1st ed. 2016
  • Language: English
  • Returnable: Y
  • Spine Width: 6 mm
  • Weight: 335 gr


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