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Noise in High-Frequency Circuits and Oscillators

Noise in High-Frequency Circuits and Oscillators


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About the Book

A classroom-tested book addressing key issues of electricalnoise

This book examines noise phenomena in linear and nonlinearhigh-frequency circuits from both qualitative and quantitativeperspectives. The authors explore important noise mechanisms usingequivalent sources and analytical and numerical methods. Readerslearn how to manage electrical noise to improve the sensitivity andresolution of communication, navigation, measurement, and otherelectronic systems.

Noise in High-Frequency Circuits and Oscillators has its originsin a university course taught by the authors. As a result, it isthoroughly classroom-tested and carefully structured to facilitatelearning. Readers are given a solid foundation in the basics thatallows them to proceed to more advanced and sophisticated themessuch as computer-aided noise simulation of high-frequencycircuits.

Following a discussion of mathematical and system-orientedfundamentals, the book covers:

  • Noise of linear one- and two-ports
  • Measurement of noise parameters
  • Noise of diodes and transistors
  • Parametric circuits
  • Noise in nonlinear circuits
  • Noise in oscillators
  • Quantization noise

Each chapter contains a set of numerical and analytical problemsthat enable readers to apply their newfound knowledge to real-worldproblems. Solutions are provided in the appendices.

With their many years of classroom experience, the authors havedesigned a book that is ideal for graduate students in engineeringand physics. It also addresses key issues and points to solutionsfor engineers working in the burgeoning satellite and wirelesscommunications industries.


About the Author: BURKHARD SCHIEK, PhD, is Professor in the Electrical Engineering Department of Ruhr- Universität Bochum.

ILONA ROLFES, PhD, is Professor in the Electrical Engineering Department of Universität Hannover.

HEINZ-JÜRGEN SIWERIS, PhD, is Professor in the Electrical Engineering Department of the University of Applied Science in Regensburg.


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Product Details
  • ISBN-13: 9780471706076
  • Publisher: Wiley-Interscience
  • Publisher Imprint: Wiley-Interscience
  • Height: 239 mm
  • No of Pages: 424
  • Series Title: English
  • Weight: 861 gr
  • ISBN-10: 0471706078
  • Publisher Date: 01 Jun 2006
  • Binding: Hardback
  • Language: English
  • Returnable: N
  • Spine Width: 33 mm
  • Width: 171 mm


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